11 results
Probing the Element Distribution at the Organic-Inorganic Interface Using EDS
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 6-7
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- July 2017
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Advanced Chemical Analysis Using an Annular Four-Channel Silicon Drift Detector
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- Journal:
- Microscopy Today / Volume 25 / Issue 2 / March 2017
- Published online by Cambridge University Press:
- 06 March 2017, pp. 30-35
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- March 2017
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Composition Analysis with EDS; Possibilities for Life Science
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1160-1161
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- July 2016
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STEM-EDXS System for Atomic-Sensitivity Elemental Mapping
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 339-340
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- August 2015
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Name that Atom in 60 Seconds or Less: Energy Dispersive X-Ray Spectroscopy of Individual Heteroatoms in Low Dimensional Materials
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1427-1428
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- August 2015
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Element Analysis by EDX for Life Science: Light Elements and Bio-Mineralization
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 222-223
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- August 2013
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Microanalysis Software: Properties and Requirements
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 834-835
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- August 2013
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Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 976-977
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- July 2012
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SDD-EDS: Element Analysis of Nanostructures in TEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1058-1059
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- July 2012
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Recent Developments in Silicon Drift Detector Technology: Atomic to mm Scale
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1170-1171
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- July 2011
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Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1200-1201
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- July 2011
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