Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below

M Falke; A Kaeppel; R Terborg

doi:10.1017/S1431927611006878

Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below

Published online by Cambridge University Press: 09 April 2017

M Falke ,

A Kaeppel and

R Terborg

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M Falke: Affiliation:
Bruker Nano GmbH, Germany
A Kaeppel: Affiliation:
Bruker Nano GmbH, Germany
R Terborg: Affiliation:
Bruker Nano GmbH, Germany

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1200 - 1201

DOI: https://doi.org/10.1017/S1431927611006878 [Opens in a new window]

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Silicon Drift Detectors for Chemical Analysis on the nm-Scale and Below

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