Materials Science Applications
Comparison of Cliff–Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films
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- 31 May 2018, pp. 193-206
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Secondary Electron Energy Contrast of Localized Buried Charge in Metal–Insulator–Silicon Structures
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- 02 October 2018, pp. 453-460
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Quantification of Olivine Using Fe Lα in Electron Probe Microanalysis (EPMA)
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- 27 February 2018, pp. 1-7
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An Examination of the Composition and Microstructure of Coarse Intermetallic Particles in AA2099-T8, Including Li Detection
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- 18 June 2018, pp. 325-341
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Microscopic Chemical Characterization and Reactivity in Cementing Systems of Elephant Grass Leaf Ashes
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- 16 October 2018, pp. 593-603
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Analytical and Instrumentation Science Symposia
Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms
Abstract
My Sixty Years Spent with Professor Hatsujiro Hashimoto
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- 01 August 2018, pp. 2-3
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INSTRUMENTATION & METHODS
Coherent imaging
Abstract
A New Look on Biomineralization With X-ray Crystalline 3D Microscopy
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- 10 August 2018, pp. 2-5
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Materials Science Applications
The Accuracy of Al and Cu Film Thickness Determinations and the Implications for Electron Probe Microanalysis
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- 27 April 2018, pp. 83-92
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Deformation Mechanisms in a Rolled Magnesium Alloy Under Tension Along the Rolling Direction
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- 28 June 2018, pp. 207-213
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Analytical and Instrumentation Science Symposia
Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms
Abstract
Atomic Resolution Imaging of Dislocations in AlGaN and the Efficiency of UV LEDs
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- 01 August 2018, pp. 4-5
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INSTRUMENTATION & METHODS
Coherent imaging
Abstract
Coherent X-ray Diffractive Imaging of Topological Defects in Operando Energy Storage Materials
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- 10 August 2018, pp. 6-7
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Materials Science Applications
Nano-Cathodoluminescence Measurement of Asymmetric Carrier Trapping and Radiative Recombination in GaN and InGaN Quantum Disks
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- 27 April 2018, pp. 93-98
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The Influence of Beam Broadening on the Spatial Resolution of Annular Dark Field Scanning Transmission Electron Microscopy
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- 27 February 2018, pp. 8-16
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Secondary Fluorescence in WDS: The Role of Spectrometer Positioning
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- 03 December 2018, pp. 604-611
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Interpreting Atom Probe Data from Oxide–Metal Interfaces
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- 03 September 2018, pp. 342-349
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Description of Ore Particles from X-Ray Microtomography (XMT) Images, Supported by Scanning Electron Microscope (SEM)-Based Image Analysis
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- 10 October 2018, pp. 461-470
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INSTRUMENTATION & METHODS
Coherent imaging
Abstract
The COSMIC Imaging Beamline at the Advanced Light Source: a new facility for spectro-microscopy of nano-materials
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- 10 August 2018, pp. 8-11
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Biological Science Applications
A Simple Method for the Cross-Section Area Determination of Single Profiled Fibers and Its Application
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- 30 January 2018, pp. 17-28
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Materials Science Applications
On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope
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- 28 March 2018, pp. 99-106
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Electron Beam-Induced Carbon Erosion and the Impact on Electron Probe Microanalysis
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- 16 November 2018, pp. 612-622
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