Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-23T06:28:18.575Z Has data issue: false hasContentIssue false
  • English
  • Français

The COSMIC Imaging Beamline at the Advanced Light Source: a new facility for spectro-microscopy of nano-materials

Published online by Cambridge University Press:  10 August 2018

David A. Shapiro ,
Richard Celestre ,
Bjoern Enders ,
John Joseph ,
Harinarayan Krishnan ,
Matthew A. Marcus ,
Kasra Nowrouzi ,
Howard Padmore ,
Jungjin Park  and
Anthony Warwick
...Show all authors
David A. Shapiro*
Affiliation:
Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA
Richard Celestre
Affiliation:
Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA
Bjoern Enders
Affiliation:
Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA Department of Physics, University of California at Berkeley, Berkeley, CA94720, USA
John Joseph
Affiliation:
Engineering Division, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA
Harinarayan Krishnan
Affiliation:
Computational Research Division, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA
Matthew A. Marcus
Affiliation:
Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA
Kasra Nowrouzi
Affiliation:
Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA Department of Physics, University of California at Berkeley, Berkeley, CA94720, USA
Howard Padmore
Affiliation:
Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA
Jungjin Park
Affiliation:
Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA School of Chemical and Biological Engineering, Seoul National University, Seoul, Republic of Korea.
Anthony Warwick
Affiliation:
Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA
Young-Sang Yu
Affiliation:
Advanced Light Source, Lawrence Berkeley National Lab, Berkeley, CA, 94720, USA
*
* Corresponding author, [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 8 - 11
Copyright
© Microscopy Society of America 2018 

References

[1] Warwick, T., et al, LSBL-1033. RevA 2012.Google Scholar
[2] Shapiro, D.A., et al, Journal of Physics: Conference Series 425(19 2012.Google Scholar
[3] Thibault, P., et al, Science 321, 379–382, 2008.Google Scholar
[4] Dierolf, M., et al, Nature 467, 436–439, 2010.Google Scholar
[5] Shapiro, D.A., et al, Nat. Photonics 8, 765 2014.CrossRefGoogle Scholar
[6] Chao, W., et al, Nature 435, 1210 2005.CrossRefGoogle Scholar
[7] Denes, P., et al, Rev. Sci. Instrum. 80, 083302 2009.Google Scholar
[8] Marchesini, S., et al, Journal of Applied Crystallography 49(4 2016.CrossRefGoogle Scholar
[9] The ALS is supported by the Director, Office of Science, Office of Basic Energy Sciences, of the US Department of Energy (contract no. DE-AC02-05CH11231). This work is partially supported by the Center for Applied Mathematics for Energy Research Applications (CAMERA), which is a partnership between Basic Energy Sciences (BES) and Advanced Scientific Computing Research (ASRC) at the US Department of Energy.Google Scholar