Focus Issue: Aberration Corrected Transmission Electron Microscopy
Aberration Corrected Transmission Electron Microscopy
Introduction
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- Published online by Cambridge University Press:
- 14 March 2017, p. 911
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Invited Article
Recent studies of oxide-semiconductor heterostructures using aberration-corrected scanning transmission electron microscopy
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- Published online by Cambridge University Press:
- 01 August 2016, pp. 912-920
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Invited Feature Paper
Observation of compound semiconductors and heterovalent interfaces using aberration-corrected scanning transmission electron microscopy
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- 30 August 2016, pp. 921-927
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Review
New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy
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- 13 December 2016, pp. 928-935
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Articles
Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination
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- 13 December 2016, pp. 936-946
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An effect of crystal tilt on the determination of ions displacements in perovskite oxides under BF/HAADF-STEM imaging mode
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- 10 October 2016, pp. 947-956
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3D polarization texture of a symmetric 4-fold flux closure domain in strained ferroelectric PbTiO3 films
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- Published online by Cambridge University Press:
- 12 July 2016, pp. 957-967
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Beam-induced atomic migration at Ag-containing nanofacets at an asymmetric Cu grain boundary
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- 14 November 2016, pp. 968-982
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Study of phase separation in an InGaN alloy by electron energy loss spectroscopy in an aberration corrected monochromated scanning transmission electron microscope
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- 08 December 2016, pp. 983-995
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Aberration-corrected self-interference of split higher order Laue zone line for measuring the z-dependent strain profile
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- 16 January 2017, pp. 996-1008
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Front Cover (OFC, IFC) and matter
JMR volume 32 issue 5 Cover and Front matter
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- 14 March 2017, pp. f1-f4
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Back Cover (OBC, IBC) and matter
JMR volume 32 issue 5 Cover and Back matter
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- 14 March 2017, pp. b1-b6
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