Powder Diffraction: Volume 18 -

$Published on behalf of International Centre for Diffraction Data$

Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 18 - June 2003

Contents

Page 8 of 10

Denver X-Ray Conference

D105 Effect of Beam Divergence on Strain Data from Neutron Diffraction
E. Üstündag, R. A. Karnesky, I. C. Noyan, B. Clausen, M. R. Daymond, J. W. Richardson, Jr.
Published online by Cambridge University Press:

20 May 2016, p. 178
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D023 Stress Errors Associated with Miniaturization of Pusai Assembly X-ray Stress Analyzer
T. Goto
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20 May 2016, p. 178
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D042 Intensity vs. Resolution and Peak Shape in X-ray Diffraction; Single and Double Goebel Mirror Configurations Compared to Standard Parafocusing Optics
E. J. Peterson, W. L. Hults, J. A. Valdez, H. Cordes, J. B. Litteer
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20 May 2016, p. 178
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D052 Evaluation of XRPD Data from Reflection and Transmission Geometry Instruments with Multilayer and Crystal Optics Employing Point and Position-Sensitive Detectors
S. T. Misture, M. D. Dolan
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20 May 2016, p. 178
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D083 The Art of X-ray Analysis of Art: Identifying Paint Pigments in Ancient Masterpieces
J. Te Nijenhuis, M. J. Fransen
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20 May 2016, p. 178
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D029 X-ray Stress Analysis Method Based on Laue Symmetries for Thin Films
R. Yokoyama, J. Harada, K. Tanaka
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20 May 2016, p. 178
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D061 Strain Relaxation Calculations and Error Analysis: High Resolution X-ray Diffraction Reciprocal Space Maps
E. D. Meserole, A. M. Noori, M. S. Goorsky
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20 May 2016, p. 178
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D077 Computer Simulation of Diffraction Technique Applied to Measurements of Surface Stress Gradients
J. T. Assis, V. I. Monine, S. A. Filippov, A. Merendaz
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20 May 2016, p. 178
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D085 Selfconsistent Determination of the X-ray Elastic Stress Factors of Polycrystalline Materials for Arbitrary Crystal Symmetry and Grain Shape
H. Wern, T. Brissier, M. Kreutzer
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20 May 2016, p. 178
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D084 A New and Efficient Method to Determine Strain/Stress Depth Profiles from Diffraction Experiments
H. Wern, Ch. Klein
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20 May 2016, p. 178
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C09 Development of a New Positron Lifetime Spectroscopy Technique for Stress and Defect Characterization in Thick Materials
F. A. Selim, D. P. Wells, J. F. Harmon, J. Kwofie
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20 May 2016, p. 179
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D133 X-ray Diffraction at IBM - Invited
C. C. Goldsmith, I. C. Noyan
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20 May 2016, p. 179
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D132 Upgrades of the X-ray and Neutron Diffraction Residual Stress Mapping Facilities at ORNL
C. R. Hubbard, T. R. Watkins, S. Spooner, S. Craig, M. C. Wright
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20 May 2016, p. 179
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D126 XRD for Industry: Selected Examples from a Small Private Laboratory - Invited
H. E. Goebel
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20 May 2016, p. 179
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D072 X-ray Diffraction at Dupont Central Research and Development - Invited
T. G. Amos, M. K. Crawford, W. E. Guise, Jr.
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20 May 2016, p. 179
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D024 X-ray Diffraction and More at GE Global Research Center - Invited
Y. Gao
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20 May 2016, p. 179
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D059 Rocking Curve Analysis of Zinc Oxide Thin Films - Invited
G. R. Kowach
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20 May 2016, p. 179
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D115 Materials Characterization Using a Novel Simultaneous Near Infrared/X-ray Diffraction Instrument
T. Blanton, C. Barnes, J. Putrelo, A. Yeboah, S. Switalski
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20 May 2016, p. 179
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D131 Texture Measurements on Long-Lengths of High Temperature Superconductors
J. L. Reeves, V. Selvamanickam, H. Huang, J. Burdett, R. L. Snyder
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20 May 2016, p. 179
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D014 A Comparison of New and Traditional Routes for Prosthetic Coating Fabrication
K. D. Rogers, S. E. Etok, R. Scott
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20 May 2016, p. 179
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Page 8 of 10

Powder Diffraction

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Volume 18 - June 2003

Denver X-Ray Conference

D105 Effect of Beam Divergence on Strain Data from Neutron Diffraction

D023 Stress Errors Associated with Miniaturization of Pusai Assembly X-ray Stress Analyzer

D042 Intensity vs. Resolution and Peak Shape in X-ray Diffraction; Single and Double Goebel Mirror Configurations Compared to Standard Parafocusing Optics

D052 Evaluation of XRPD Data from Reflection and Transmission Geometry Instruments with Multilayer and Crystal Optics Employing Point and Position-Sensitive Detectors

D083 The Art of X-ray Analysis of Art: Identifying Paint Pigments in Ancient Masterpieces

D029 X-ray Stress Analysis Method Based on Laue Symmetries for Thin Films

D061 Strain Relaxation Calculations and Error Analysis: High Resolution X-ray Diffraction Reciprocal Space Maps

D077 Computer Simulation of Diffraction Technique Applied to Measurements of Surface Stress Gradients

D085 Selfconsistent Determination of the X-ray Elastic Stress Factors of Polycrystalline Materials for Arbitrary Crystal Symmetry and Grain Shape

D084 A New and Efficient Method to Determine Strain/Stress Depth Profiles from Diffraction Experiments

C09 Development of a New Positron Lifetime Spectroscopy Technique for Stress and Defect Characterization in Thick Materials

D133 X-ray Diffraction at IBM - Invited

D132 Upgrades of the X-ray and Neutron Diffraction Residual Stress Mapping Facilities at ORNL

D126 XRD for Industry: Selected Examples from a Small Private Laboratory - Invited

D072 X-ray Diffraction at Dupont Central Research and Development - Invited

D024 X-ray Diffraction and More at GE Global Research Center - Invited

D059 Rocking Curve Analysis of Zinc Oxide Thin Films - Invited

D115 Materials Characterization Using a Novel Simultaneous Near Infrared/X-ray Diffraction Instrument

D131 Texture Measurements on Long-Lengths of High Temperature Superconductors

D014 A Comparison of New and Traditional Routes for Prosthetic Coating Fabrication

Powder Diffraction

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Volume 18 - June 2003

Denver X-Ray Conference