X-Ray Fluorescence and Related Techniques
X-ray microtomographic imaging and analysis for basic research
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- 01 March 2012, pp. 125-131
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Technical Articles
X-ray powder diffraction characterization of disilver trihydrogen paraperiodate
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- 01 March 2012, pp. 52-55
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New Diffraction Data
X-ray powder diffraction data for rhombohedral AlPt
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- 01 March 2012, pp. 318-319
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Powder diffraction data for N,N'-diphenylguanidinium nitrate at room and low temperatures
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- 01 March 2012, pp. 241-244
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X-Ray Fluorescence and Related Techniques
X-ray backscatter imaging: Photography through barriers
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- 01 March 2012, pp. 132-135
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New Diffraction Data
X-ray powder diffraction data and crystal data of polymorphic form 2 of carnidazole
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- 01 March 2012, pp. 56-58
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X-ray powder diffraction analysis of tegafur
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- 01 March 2012, pp. 245-247
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Laboratory Notes
An easy to use X-ray collimator for Mao-Bell type diamond anvil cell
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- 01 March 2012, pp. 320-322
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New Diffraction Data
X-ray powder diffraction data for botallackite
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- 01 March 2012, pp. 59-62
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Laboratory Note
A simple method of monitoring the size, location, and inhomogeneity of the incident X-ray beam in a powder diffractometer
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- 01 March 2012, pp. 248-249
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X-Ray Fluorescence and Related Techniques
Detection of visible and latent fingerprints by micro-X-ray fluorescence
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- 01 March 2012, pp. 136-139
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Laboratory Notes
Capillaries prepared from thin-walled heat-shrink poly(ethylene terephthalate) (PET) tubing for X-ray powder diffraction analysis
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- 01 March 2012, pp. 323-325
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X-Ray Fluorescence and Related Techniques
Quantitative energy-dispersive electron probe X-ray microanalysis of individual particles
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- 01 March 2012, pp. 140-144
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International Reports
ICDD Spring Meetings
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- 01 March 2012, pp. 250-255
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New Diffraction Data
Powder X-ray diffraction study of a new polymorph of Al2(WO4)3
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- 01 March 2012, pp. 63-66
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International Reports
The 55th Annual Denver X-ray Conference (DXC)
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- 01 March 2012, pp. 326-327
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10th European Powder Diffraction Conference (EPDIC-10)
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- 01 March 2012, p. 328
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Crystallography Education
R factors in Rietveld analysis: How good is good enough?
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- 01 March 2012, pp. 67-70
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X-Ray Fluorescence and Related Techniques
Characterizing process semiconductor thin films with a confocal micro X-ray fluorescence microscope
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- 01 March 2012, pp. 145-147
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International Reports
The 2005 Annual Meeting of the Crystallographic Society of Japan
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- 01 March 2012, pp. 255-256
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