Research Article
Determination of Electrically Active Defect Profiles in Semiconductors Using a Photoelectrochemical Technique
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- 26 February 2011, 151
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Nondestructive Evaluation of Tubing Closure Welds
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- 26 February 2011, 157
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Combined Atom-Probe and Electron Microscopy Characterization of Fine Scale Structures in Aged Primary Coolant Pipe Stainless Steel
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- 26 February 2011, 163
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Combined Use of Small Angle Neutron Scattering (Sans) and (Conventional and High Resolution) Electron Microscopy for the Characterization of Early Stages of Ordering and Phase Separation in Ni-Ti
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- 26 February 2011, 169
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Accurate Interatomic Potentials for Ni, Al and Ni3Al
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- 26 February 2011, 175
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Theoretical Studies of Defects in Binary and Ternary Oxides*
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- 26 February 2011, 181
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Atomic Displacements Around Nitrogen Interstitial Impurities in Ta and Nb
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- 26 February 2011, 187
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Synchrotron X-Ray Topography of Dislocation Arrays
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- 26 February 2011, 197
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The Contrast of Dislocations in X-Ray Topographs of Homogeneously Bent Silicon Crystals
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- 26 February 2011, 209
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X-Ray Double Crystal Topography of Processed Silicon Wafers
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- 26 February 2011, 215
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X-Ray Topographic Methods for Stress-Strain Tensor Analyses of Crystals
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- 26 February 2011, 221
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Digital X-Ray Rocking Curve Topography
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- 26 February 2011, 227
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Infrared Cathodoluminescence Studies from Dislocations in Silicon in tem, a Fourier Transform Spectrometer for Cl in Tem and Els/cl Coincidence Measurements of Lifetimes in Semiconductors
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- 26 February 2011, 235
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Charging Microscopy of Semi-Insulating Gallium Arsenide
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- 26 February 2011, 247
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Partial Dislocation Mobility in GaAS
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- 26 February 2011, 253
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The Structural and Electrical Characterization of Copper Decorated Boundaries in Silicon Bicrystals*
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- 26 February 2011, 259
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Periodic {001} Walls of Defects in Proton-Irradiated Cu and Ni
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- 26 February 2011, 265
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Dislocation-Solute Interactions at Twin Boundaries in Dendritic Web Silicon
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- 26 February 2011, 271
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Nondestructive Evaluation of Dislocation Subgrain Structures in Silicon Using Thermal Wave Imaging Techniques
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- 26 February 2011, 277
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Photoluminescence Investigation of Dislocation-Related Defects in High Purity Silicon
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- 26 February 2011, 283
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