Microscopy and Microanalysis: Volume 9 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - August 2003

Invited Papers

Thinning and Cleaning Treatment to Advance the Quality of FIB Samples for Transmission Electron Microscopy

Abstract

Effects of Composition on Structural and Magnetic Properties of Free-Standing Single Crystal Ferromagnetic Shape Memory Ni-Mn-Ga Films Grown by Molecular Beam Epitaxy

Invited Papers

Critical Dimension Analysis of Thin (~100 nm) Gold Coatings by SEM and EDS

Improving image storage and access in an integrated microscopy unit: experiences with a commercial image database system

Abstract

Characterization of (Tb/Mo) Multilayers using the Scanning Auger Microprobe

Strategies for x-ray analysis of non-conductive specimens in a conventional scanning electron microscope

Invited Papers

Recent camera developments for TEM

Practical Applications of the Fourier Transformation in Electron Microscopy (Part 2)

Abstract

Capability and Uncertainty of Standardless Procedures for Quantitative Electron Probe X-ray Microanalysis

Front matter

MAM volume 9 issue S03 Cover and Front matter

Abstract

Trace and Small Phase Analysis : a New Generation of Column for Electron Microprobe

Report from the NIST-MAS Workshop on “The Accuracy Barrier in Quantitative EPMA and the Role of Standards”

Improvements to Light Element X-Ray Windows for SiLi Detectors

A Proposal for a Standard Nomenclature and Interactive Database of Parameters and Correction Algorithms Used in Quantitative Electron Probe Microanalysis

Penelope, A Monte Carlo Tool For Quantitative Electron Probe Microanalysis

Spatial Resolution Limits for X-ray Microanalysis of Bulk Samples

Precipitate Evolution In Zry-4 Oxidation

Transverse Coefficient of Thermal Expansion Determination of Carbon Fibers Using ESEM and TEM at High Temperature

Processing, Microstructure, and Performance of Metallic Orthopaedic Medical Devices

Polarized Light Microscopy – an Essential Method for the Investigation of the Recrystallization of Aluminum Alloys

Microscopy and Microanalysis

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Volume 9 - August 2003

Invited Papers

Abstract

Invited Papers

Abstract

Invited Papers

Abstract

Front matter

Abstract