Book Review
Transmission Electron Microscopy; Diffraction, Imaging, and Spectrometry C. Barry Carter and David B. Williams (Eds.). Springer International Publishing, Switzerland 2016, 518 pp. ISBN: 978-3-3-319-26649-7.
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- 28 June 2018, p. 324
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Analytical and Instrumentation Science Symposia
Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms
Abstract
HREM and Analytical TEM of the Rapidly Solidified Microstructure Evolved at the Extremes of the Coupled Crystal Growth Regime in Hypo-Eutectic Al-Cu Alloys
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- 01 August 2018, pp. 34-35
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Book Review
Scanning Electron Microscopy and X-Ray Microanalysis 4th Edition, Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, Springer, 2018, 550 pp. ISBN:978-1-4939-6674-5.
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- 30 October 2018, p. 768
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Front Cover (OFC, IFC) and matter
MAM volume 24 issue 3 Cover and Front matter
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- 28 June 2018, pp. f1-f14
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MAM volume 24 issue 6 Cover and Front matter
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- Published online by Cambridge University Press:
- 27 December 2018, pp. f1-f12
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INSTRUMENTATION & METHODS
Coherent imaging
Abstract
Coherence Branch at I13, DLS: The Multiscale, Multimodal, Ptycho-tomographic End Station
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- 10 August 2018, pp. 40-41
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Analytical and Instrumentation Science Symposia
Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms
Abstract
Examination of the Structural Quality of InAsSbBi Epilayers using Cross Section Transmission Electron Microscopy
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- 01 August 2018, pp. 36-37
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INSTRUMENTATION & METHODS
Coherent imaging
Abstract
Eliminating Decoherence Effects and Improving Reconstructed Image Quality in Soft X-ray Ptychography.
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- 10 August 2018, pp. 42-43
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Back Cover (OBC, IBC) and matter
MAM volume 24 issue 3 Cover and Back matter
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- Published online by Cambridge University Press:
- 28 June 2018, pp. b1-b14
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MAM volume 24 issue 6 Cover and Back matter
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- Published online by Cambridge University Press:
- 27 December 2018, pp. b1-b14
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Analytical and Instrumentation Science Symposia
Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms
Abstract
TEM/SAED Study of Mn2CrGaAl and CoFeCrGe Heusler Alloys
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- 01 August 2018, pp. 38-39
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SIS-HOLZ Strain Measurements Through the Thickness of a SI Crystal
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- 01 August 2018, pp. 40-41
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INSTRUMENTATION & METHODS
Coherent imaging
Abstract
Soft X-ray Spectro-Ptychography for Air Pollution Particulates
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 44-45
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Ptychography with a Virtually Enlarged Illumination.
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- 10 August 2018, pp. 46-47
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Analytical and Instrumentation Science Symposia
Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms
Abstract
TEM Investigation on Eutectic Phase Formation in Ni-30Cr Filler Metal 52XL
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- 01 August 2018, pp. 42-43
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INSTRUMENTATION & METHODS
Coherent imaging
Abstract
Numerical Analysis of Antiphase Domain Boundaries in a FeAl Alloy Using X-Ray Bragg Coherent Diffractive Imaging
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- 10 August 2018, pp. 48-49
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Analytical and Instrumentation Science Symposia
Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms
Abstract
Structural Determination of GnGaC Nanolaminates by Electron Microscopy: Resistant Materials Under Thermal Damage
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- 01 August 2018, pp. 44-45
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INSTRUMENTATION & METHODS
Coherent imaging
Abstract
Coherent Hard X-ray Multiprojection Imaging
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- 10 August 2018, pp. 50-51
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Analytical and Instrumentation Science Symposia
Professor Hatsujiro Hashimoto Memorial Symposium: Foundations in Imaging Crystals, Defects, and Atoms
Abstract
Identification of Chemical Dopants in YBa2Cu3O7-δ by Electron Probe Microanalyzer
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- 01 August 2018, pp. 46-47
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INSTRUMENTATION & METHODS
Coherent imaging
Abstract
Performance and Ongoing Development of the Velociprobe, a Fast Hard X-ray Nanoprobe for High-Resolution Ptychographic Imaging
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- 10 August 2018, pp. 52-53
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