Advances in Energy-Filtered Transmission Electron Microscopy
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New Developments in Energy-filtering Transmission Electron Microscopy
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- 01 August 2005, pp. 48-49
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3D Elemental Distributions in Biological Structures by EFTEM Tomography
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- 01 August 2005, pp. 50-51
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WEEK AT A GLANCE
WEEK AT A GLANCE
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- 10 June 2005, pp. 82-88
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Characterization of Thin Films Using Different Scanning Probe Microscopy (SPM) Modes
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- 30 December 2005, pp. 102-105
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SCIENTIFIC PROGRAM
SCIENTIFIC PROGRAM
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- 10 June 2005, pp. 91-152
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Characterizing the Limits of EBSD Analysis
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Improving the Spatial Resolution of EBSD
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- 01 August 2005, pp. 52-53
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Fabrication of Selective Metal Contacts on Single-Walled Carbon Nanotubes for Device Applications
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- 30 December 2005, pp. 106-109
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Atomic Force Microscopy Applied to the Study of Dewetting Patterns of Thin Films from Polymer Solutions
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- 30 December 2005, pp. 110-113
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AUTHOR INDEX
AUTHOR INDEX
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- 10 June 2005, pp. 153-167
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Characterizing the Limits of EBSD Analysis
Research Article
Defining Electron Backscatter Diffraction Resolution
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- 01 August 2005, pp. 54-55
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Atomic Force Microscopy (AFM) Studies of Cured Self-Assembled Films for Chemical Sensor Applications
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- 30 December 2005, pp. 114-117
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EXHIBITOR DIRECTORY
EXHIBITOR DIRECTORY AND EXHIBITOR ROOM FLOOR PLAN
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- 10 June 2005, pp. 168-169
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Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley
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High Resolution Electron Microscopy of Carbonaceous Materials
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- 01 August 2005, pp. 56-57
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Morphology Dependence on Fluorine Doped Tin Oxide Film Thickness Studied with Atomic Force Microscopy
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- 30 December 2005, pp. 118-121
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VENDOR DIRECTORY
VENDOR DIRECTORY
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- 10 June 2005, pp. 171-190
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Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley
Research Article
Strategies for Aberration Control in Sub-Angstrom HRTEM
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- 01 August 2005, pp. 58-59
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Digital Imaging
Research Article
Single Particle Reconstructions at Subnanometer Resolution from a JEOL 2010F and a 4k x 4k Gatan CCD Camera
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- 01 August 2005, pp. 60-61
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CALL FOR MSA AWARD NOMINATIONS
CALL FOR NOMINATION OF INDIVIDUALS TO BE CONSIDERED FOR MAJOR AWARDS BY THE MICROSCOPY SOCIETY OF AMERICA
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- 10 June 2005, p. 191
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Materials Applications
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Characterization of PMMA/PVB Blend Films by Means of AFM
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- 30 December 2005, pp. 122-125
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Digital Imaging
Research Article
Analysis of the Performance of an 8k x 8k Lens Coupled Detector for Wide-field, High-resolution Transmission Electron Microscopy (TEM)
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- 01 August 2005, pp. 62-63
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