Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Login Alert

Log in

×

×

Back to search results

Home
Journals
Microscopy and Microanalysis
Volume 11

English
Français

Microscopy and Microanalysis

Add bookmark

Share

Search within full text

Other actions

Journal Home

Journal home
Micrographia
Sample content
Collections
FirstView articles
Latest issue
All issues
Most cited

Refine listing

Refine listing

Access:

Only show content I have access to (1084)

Publication date:

Over 3 years (1219)

Topic: Show more

Nanostructured materials (54)

Quantitative Characterization, Simulation, and Representation of Microstructures (40)

Advances in High-Resolution Electron Microscopy: A Symposium Dedicated to the Memory of John Maxwell Cowley (38)

Breakthrough Microscopy in Catalysis, Nanoparticles and Energy (33)

High-Resolution STEM Analysis of Functional NanoMaterials (33)

Cell Pathology (32)

FIB/Dual Platform Applications and Techniques in Biological and Physical Sciences (32)

Materials Research in an Aberration-Free Environment (30)

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday (30)

Tomography in Biological and Materials Sciences (28)

Microbiology, Pathogenesis and Pathology (24)

Quantitative X-ray Microanalysis (24)

Variable Pressure Electron Microscopy: Advances in the Nanotechnology and Biomaterials Age (24)

Cryo-EM of Molecular Assemblies (22)

Advances in In-situ Electron Microsocpy Technique and Applications (21)

Failure Analysis and Prevention (21)

Materials Applications (21)

Advances in Instrumentation and Technique (20)

Botany (20)

From the Static to the Dynamic: Correlative and High Resolution Biological Imaging and Labeling (20)

Presidential Symposium: The Golden Anniversary of Imaging Atoms (20)

Scanned Probe Microscopy and Nanoanalysis: Probing Properties at the Nanoscale (20)

Biological Applications (19)

Manipulation of Microstructure to Improve Properties and Performance (19)

Metals and Alloys (19)

Magnetic and Superconducting Materials (18)

Advances in Energy-Filtered Transmission Electron Microscopy (17)

Biological Specimen Preparation (17)

Characterizing the Limits of EBSD Analysis (16)

Microanalysis of Extraterrestrial Materials: New Techniques and Applications (16)

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Industry (16)

Scanning Electron Microscopy (SEM) (16)

Semiconductors (16)

Advanced Detectors (15)

Advances in Microstructurial Characterization Techniques (15)

Recent Progress in 3D Microscopy Imaging (14)

Spectral Imaging: Advances and Applications (14)

Advances in Ultrastructural Studies at Low Temperatures for Cryo TEM and SEM (13)

Interfaces (13)

Radiation Effects in Materials (13)

Reproduction and Development (13)

Structural Biology (13)

Biomaterials and Tissue Engineering (12)

Nano Scale Engineering & Self Assembly (12)

Vascular Corrosion Casting (12)

Modes of Cell-Cell and Cell-ECM Communication (11)

Digital Imaging (10)

Phase Transformations (10)

Green Fluorescent Protein and its Relatives (9)

Metallographic Techniques and Applications (9)

Advances in Fluorescence, Flow Cytometry and Cytomics (8)

Confocal Microscopy (8)

Microscopy and Imaging in the Digital Age (8)

Oxidation (8)

STEM Cells (8)

Films / Coatings (7)

Geology (7)

Ultrafast Electron Diffraction and Microscopy (7)

Composites (6)

Particle Analysis (6)

Specimen Preparation for Materials Sciences (6)

Technologists’ Forum: Low Temperature Technologies for Electron Microscopy (6)

Fluorescence (Förster) Resonance Energy Transfer (FRET) Microscopy (5)

Ceramics (4)

Core Facility Management (4)

Crystallography (4)

Polymers (4)

Ferroelectrics (3)

Corporate Session (2)

Industrial Real World Microscopy (2)

Building Order in Large Image Data Sets: Classification Techniques at Work! (1)

Computational Tools for Interpreting Electron Tomograms (1)

Confocal Microscopy System Performance: Spectroscopy and Foundations for Quantitation (1)

Erratum (1)

Improved Electron Microscopy with Monte Carlo Simulations (1)

In-situ Electron Microscopy: A Practical Tutorial (1)

Quantum Dots as Cellular Probes for Light and Electron Microscopy (1)

Theory and Applications of Focal-Series Reconstruction in HRTEM (1)

What is Fluctuation Electron Microscopy? (1)

Classifications

Actions for selected content:

Select all | Deselect all

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Search Title: required Please provide a title, maximum of 40 characters.

×

< Back to all issues

Volume 11 - October 2005

Contents

Page 40 of 61

First
« Prev
37
38
39
40
41
42
43
Next »
Last

Quantitative X-ray Microanalysis

Research Article

Blunders in Automatic Qualitative Analysis (Peak Identification) for Energy Dispersive X-ray Spectrometry: The Low Voltage Microanalysis Situation
D E Newbury
Published online by Cambridge University Press:

01 August 2005, pp. 1286-1287
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Testing Win X-ray, a Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope
H Campbell, R Gauvin
Published online by Cambridge University Press:

01 August 2005, pp. 1288-1289
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Spectrum Simulation with NISTMonte
N W M Ritchie
Published online by Cambridge University Press:

01 August 2005, pp. 1290-1291
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Not-So-Routine Electron Probe Microanalyses of Jarosite
H Lowers, G Desborough, J Hammarstrom, G Swayze, K Smith, S Diehl
Published online by Cambridge University Press:

01 August 2005, pp. 1292-1293
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

NanoZAF-A Pocket-Sized Utility for Microanalytical Experiment Design
N M W Ritchie
Published online by Cambridge University Press:

01 August 2005, pp. 1294-1295
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Quantifying Heterogeneity in the Pu-Ga System
C C Davis, R E Lakis
Published online by Cambridge University Press:

01 August 2005, pp. 1296-1297
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microanalysis of Very Fine Precipitates by FE-SEM
A M Elwazri, R Varano, F Siciliano, R Gauvin, S Yue
Published online by Cambridge University Press:

01 August 2005, pp. 1298-1299
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Element Ratio Maps: A More Informative Use Of Digital Elemental X-ray Maps Than Single Element Maps
C S Schwandt, G A McKay
Published online by Cambridge University Press:

01 August 2005, pp. 1300-1301
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Examination of Interfacial Reactions of a NiAl-Hf-hBN System on a Sapphire Fibre by a Combination of EPMA and FIB Specimen Preparation
S Richter, S Kyrsta, D Hajas, J Schneider, J Mayer
Published online by Cambridge University Press:

01 August 2005, pp. 1302-1303
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Microanalysis of Hafnian Zircon
C Ma, G R Rossman
Published online by Cambridge University Press:

01 August 2005, pp. 1304-1305
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Measuring the Thickness of Native Plutonium Oxides Using EPMA
T Nothwang, C C Davis, R E Lakis
Published online by Cambridge University Press:

01 August 2005, pp. 1306-1307
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Electron Probe Microanalysis of Cr Films on Semiconducting and Insulating Substrates
M S Hatzistergos, E Lifshin
Published online by Cambridge University Press:

01 August 2005, pp. 1308-1309
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Evaluation of Uncertainties in Dating of Monazite by Electron Microprobe
C Merlet
Published online by Cambridge University Press:

01 August 2005, pp. 1310-1311
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Quantitative Electron Probe Microanalysis of Si-Ge Reference Materials
R B Marinenko, S Turner, D E Newbury, L Richter, L Yu, R Zeisler, D Simons
Published online by Cambridge University Press:

01 August 2005, pp. 1312-1313
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

A Multiple Collision and Finite Volume Code for Photon Transport Simulation
M Sumini, F Teodori, J E Fernandez, V Molinari
Published online by Cambridge University Press:

01 August 2005, pp. 1314-1315
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Scanning Electron Microscopy and X-ray Microanalysis the Next 35 Years: A Symposium Celebrating Joe Goldstein's 65th Birthday

Research Article

Laudatio for Joseph I. Goldstein on the Occasion of his 65th Birthday: Contributions to Meteoritics, Cosmochemistry, and Lunar Science
K Keil
Published online by Cambridge University Press:

01 August 2005, pp. 1316-1317
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

SEMXM—Past, Present, and Future
J I Goldstein
Published online by Cambridge University Press:

01 August 2005, pp. 1318-1319
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

The Process of Interpreting Images Obtained by Scanning Electron Microscopy
P Echlin
Published online by Cambridge University Press:

01 August 2005, pp. 1320-1321
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Nano- and Microscale Engineering of Sensors
A D Romig Jr, B K Cloer
Published online by Cambridge University Press:

01 August 2005, pp. 1322-1323
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

EBSD Characterization of Materials: From Meteorites to Welds to MEMS
J R Michael, J I Goldstein
Published online by Cambridge University Press:

01 August 2005, pp. 1324-1325
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Page 40 of 61

First
« Prev
37
38
39
40
41
42
43
Next »
Last

Our Site

Accessibility
Contact & Help
Legal Notices

Our Platforms

Cambridge Core
Cambridge Open Engage
Cambridge Higher Education

Our Products

Journals
Books
Elements
Textbooks
Courseware

Join us online

Location

Please choose a valid location.

Rights & Permissions
Copyright
Privacy Notice
Terms of Use
Cookies Policy

Cambridge University Press 2024

×