Microscopy and Microanalysis: Volume 24 - Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018)

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018)

APPLICATIONS

In-situ/operando/energy

Abstract

In-situ 3D CT-XAFS Imaging of Pt/C Cathode Catalysts in Polymer Electrolyte Fuel Cell during Degradation Processes by Anode Gas Exchange Cycles

Synchrotron X-ray Micro Tomography at the Advanced Light Source: In-Situ Sample Environments for Advanced Aerospace Materials

Time resolved

Abstract

The Making of 3D Microscopic Movies: A Look Behind the Scenes of the Fast Tomographic Imaging Program at TOMCAT

Fast In Situ Nanotomography at ESRF

Sub-100ps Magnetic Imaging at the PolLux Endstation of the Swiss Light Source

Spectromicroscopy

Abstract

Polarization-dependent Imaging Contrast (PIC) Mapping in 2018

Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy

Optimizing Soft X-ray Spectromicroscopy for Fuel Cell Studies: X-ray Damage of Ionomer.

Mapping Highly Efficient Mixed-cation Pseudohalide-perovskite Solar Cells with a Scanning Transmission X-ray Microscope

A Fast, Flexible and Accurate Monte-Carlo Tool for Simulating X-Ray Fluorescence Tomography

Microprobe Endstation at SXRMB of Canadian Light Source: Introduction and Applications

Probing the Electronic Structure of BiVO4 Coated ZnO Nanodendrite Core- Shell Nanocomposite Using X-ray Spectroscopic and Spatially Resolved Scanning Transmission X-ray Microscopy Studies

Surface Nanobubbles Produced by Cold Water Investigated Using Scanning Transmission X-ray Microscopy

Low Dose and Time Efficient Molar Fraction STXM Analysis for Binary Material Systems

Nanoscale NEXAFS for Probing TiO2-B Nanoribbons.

Status of the PolLux STXM Beamline.

Extraction of Physical Parameters from X-ray Spectromicroscopy Data Using Machine Learning

Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials

STXM Chemical Mapping of Norway Spruce Knotwood Lignans

3D Spectromicroscopic Observation of Yb-Silicate Ceramics Using XAFS-CT

Microscopy and Microanalysis

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Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018)

APPLICATIONS

In-situ/operando/energy

Abstract

Time resolved

Abstract

Spectromicroscopy

Abstract