Letter to the Editor
Letter to the Editor: Comments on “Compositional Averaging of Backscatter Intensities in Compounds,” with a Response from Donovan
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- 21 November 2003, pp. 491-492
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Materials Applications
Thin Dielectric Film Thickness Determination by Advanced Transmission Electron Microscopy
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- 21 November 2003, pp. 493-508
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Using Fluctuation Microscopy to Characterize Structural Order in Metallic Glasses
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- 21 November 2003, pp. 509-515
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Selected-Area Growth of Carbon Nanotubes by the Combination of Focused Ion Beam and Chemical Vapor Deposition Techniques
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- 21 November 2003, pp. 516-521
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Biological Applications
The Use of High Pressure Freezing and Freeze Substitution to Study Host–Pathogen Interactions in Fungal Diseases of Plants
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- 21 November 2003, pp. 522-531
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Angioarchitecture of Tumors Induced by Two Different Cloned Cell Lines Established from a Transplantable Rat Malignant Fibrous Histiocytoma
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- 21 November 2003, pp. 532-541
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Microscopy Techniques
Extending Energy-Filtered Transmission Electron Microscopy (EFTEM) into Three Dimensions Using Electron Tomography
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- 21 November 2003, pp. 542-555
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Object Oriented Database and Electronic Notebook for Transmission Electron Microscopy
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- 21 November 2003, pp. 556-565
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Electron Beam Coater for Reduction of Charging in Ice-Embedded Biological Specimens using Ti88Si12 Alloy
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- 21 November 2003, pp. 566-573
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Analysis of Orientations of Collagen Fibers by Novel Fiber-Tracking Software
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- 21 November 2003, pp. 574-580
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