Microscopy and Microanalysis: Volume 26 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

Structure, Strain Relaxation and Defects in Alkaline Earth Stannates Films

Oxygen Annealing Driven Structural Evolution in PdCoO2 Films Through Electron Microscopy

Quantitative Measurement of Topological Spin Textures via Differential Phase Contrast

Hierarchically Structured Mixed Oxide Electrodes for Oxygen Evolution Reaction: A Multimodal Electron Microscopy Study

Point Defect and Their Influence on the Atomic and Electronic Structure of β-(AlxGa1-x)2O3 Alloys by STEM-EELS

New Frontiers in Electron Microscopy of Two-dimensional Materials

Imaging the Structure and Properties of 2D Materials with 4D-STEM

4D Scanning Transmission Electron Microscopy of a Twisted WS2 Multilayer Structure

Non-equilibrium Structural Phase Transformations in Atomically Thin Transition Metal Dichalcogenides

Anomalous Linear Layer-dependent Blue Shift of Interband Transition in Two-Dimensional Materials

Mapping Stacking and Stacking Defects in the 2D Ferromagnet CrI3

Advanced Characterization of Nuclear Fuels and Materials

Advances in TEM in Situ Mechanical Testing for Nuclear Alloys

Unveiling the Early Stages of the F-element Oxalate Growth Evolution with Cryo-TEM

In-situ Micromechanical Testing of Neutron Irradiated FeCrAl Alloys

EELS Evidence for Nascent Polymerization of Carbon and Silicon in Amorphization of SiC

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Atomic Electron Tomography: Past, Present and Future

Higher-order Structure of Human Chromosomes Observed by Electron Tomography and Electron Diffraction

Optimization of EDX Tomography Acquisition Geometry for Electronic Device Characterization

Artificial Intelligence Enabled Information Inpainting and Artifact Removal for Electron Tomography

Approaching Operando Imaging of Functional Materials

Solid State Dynamics Visualized by Environmental EM

The Effect of Orientation on Cu2O Reduction Under Methanol Observed by in Situ ETEM

Microscopy and Microanalysis

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Volume 26 - Supplement S2 - August 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

New Frontiers in Electron Microscopy of Two-dimensional Materials

Advanced Characterization of Nuclear Fuels and Materials

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Approaching Operando Imaging of Functional Materials