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X-Ray Scattering and its Benefits for X-Ray Spectrometry at the SEM

Published online by Cambridge University Press:  26 July 2009

V-D Hodoroaba ,
V Rackwitz  and
D Reuter
V-D Hodoroaba
Affiliation:
Federal Institute for Materials Research & Testing,Germany
V Rackwitz
Affiliation:
Federal Institute for Materials Research & Testing,Germany
D Reuter
Affiliation:
Federal Institute for Materials Research & Testing,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1122 - 1123
Copyright
Copyright © Microscopy Society of America 2009