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A Test Material and a quick Procedure for the Performance Check of X-Ray Spectrometers attached to the SEM

Published online by Cambridge University Press:  26 July 2009

M Procop  and
V-D Hodoroaba
M Procop
Affiliation:
IfG – Institute for Scientific Instruments,Germany
V-D Hodoroaba
Affiliation:
Federal Institute for Materials Research & Testing,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1120 - 1121
Copyright
Copyright © Microscopy Society of America 2009