Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-28T04:00:51.929Z Has data issue: false hasContentIssue false

Stoichiometry of Nanocrystalline VOx Thin Films Determined by Electron Energy Loss Spectroscopy

Published online by Cambridge University Press:  26 July 2009

J Li
Affiliation:
Pennsylvania State University
BD Gauntt
Affiliation:
Pennsylvania State University
J Kulik
Affiliation:
Pennsylvania State University
EC Dickey
Affiliation:
Pennsylvania State University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009