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Novel Radio-Frequency Gun Structures for Ultrafast Relativistic Electron Diffraction

Published online by Cambridge University Press:  03 July 2009

P. Musumeci ,
L. Faillace ,
A. Fukasawa ,
J.T. Moody ,
B. O'Shea ,
J.B. Rosenzweig  and
C.M. Scoby
P. Musumeci*
Affiliation:
University of California, Los Angeles, Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547
L. Faillace
Affiliation:
University of California, Los Angeles, Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547
A. Fukasawa
Affiliation:
University of California, Los Angeles, Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547
J.T. Moody
Affiliation:
University of California, Los Angeles, Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547
B. O'Shea
Affiliation:
University of California, Los Angeles, Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547
J.B. Rosenzweig
Affiliation:
University of California, Los Angeles, Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547
C.M. Scoby
Affiliation:
University of California, Los Angeles, Department of Physics and Astronomy, 475 Portola Plaza, Los Angeles, CA 90095-1547
*
Corresponding author. E-mail: [email protected]
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Abstract

Radio-frequency (RF) photoinjector-based relativistic ultrafast electron diffraction (UED) is a promising new technique that has the potential to probe structural changes at the atomic scale with sub-100 fs temporal resolution in a single shot. We analyze the limitations on the temporal and spatial resolution of this technique considering the operating parameters of a standard 1.6 cell RF gun (which is the RF photoinjector used for the first experimental tests of relativistic UED at Stanford Linear Accelerator Center; University of California, Los Angeles; Brookhaven National Laboratory), and study the possibility of employing novel RF structures to circumvent some of these limits.

Keywords

ultrafastRF photoinjectorsrelativistic electron diffractionelectron sources
Type
Special Section: Ultrafast Electron Microscopy
Information
Microscopy and Microanalysis , Volume 15 , Issue 4 , August 2009 , pp. 290 - 297
Copyright
Copyright © Microscopy Society of America 2009

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References

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