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Latest Generation of Silicon Drift Detectors and Readout Electronics

Published online by Cambridge University Press:  05 August 2019

Andreas Pahlke ,
Florian Dams ,
Reinhard Fojt ,
Michael Fraczek ,
Jürgen Knobloch ,
Christian Luckey ,
Natsuki Miyakawa  and
Niklas Willems
Andreas Pahlke
Affiliation:
KETEK GmbH, Munich, Germany.
Florian Dams
Affiliation:
KETEK GmbH, Munich, Germany.
Reinhard Fojt
Affiliation:
KETEK GmbH, Munich, Germany.
Michael Fraczek
Affiliation:
KETEK GmbH, Munich, Germany.
Jürgen Knobloch
Affiliation:
KETEK GmbH, Munich, Germany.
Christian Luckey
Affiliation:
KETEK GmbH, Munich, Germany.
Natsuki Miyakawa
Affiliation:
KETEK GmbH, Munich, Germany.
Niklas Willems
Affiliation:
KETEK GmbH, Munich, Germany.

Abstract

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Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 558 - 559
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Huebner, S et al. , IEEE Trans. Nucl. Sci. 62 (2) (2015), p. 588.Google Scholar
[2]Huebner, S et al. , Phys. Status Solidi B 252 (11) (2015), p. 2564.Google Scholar