In-Situ Atomic-Resolution Study of Stress-Induced Unusual Large Strain Plasticity of Semiconductor nanowires

Z Zhang; X Han

doi:10.1017/S1431927609093763

In-Situ Atomic-Resolution Study of Stress-Induced Unusual Large Strain Plasticity of Semiconductor nanowires

Published online by Cambridge University Press: 26 July 2009

Z Zhang and

X Han

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Z Zhang: Affiliation:
Beijing University of Technology
X Han: Affiliation:
Beijing University of Technology

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1182 - 1183

DOI: https://doi.org/10.1017/S1431927609093763 [Opens in a new window]

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In-Situ Atomic-Resolution Study of Stress-Induced Unusual Large Strain Plasticity of Semiconductor nanowires

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