Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-30T03:47:07.821Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging At the Timescale Of Micro- and Milliseconds With the pnCCD (S)TEM Camera

Published online by Cambridge University Press:  23 September 2015

H. Ryll ,
M. Simson ,
M. Den Hertog ,
R. Dunin-Borkowski ,
K. El Hajraoui ,
R. Hartmann ,
M. Huth ,
S. Ihle ,
V. Migunov  and
J. Schmidt
...Show all authors
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
M. Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
M. Den Hertog
Affiliation:
Institut Neel-CNRS, 25 Rue des Martyrs, 38042 Grenoble, France
R. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre, Peter Grunberg Institute, Forschungszentrum Julich, Leo-Brandt-StraBe, 52425 Juelich, Germany
K. El Hajraoui
Affiliation:
Institut Neel-CNRS, 25 Rue des Martyrs, 38042 Grenoble, France
R. Hartmann
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
M. Huth
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
S. Ihle
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
V. Migunov
Affiliation:
Ernst Ruska-Centre, Peter Grunberg Institute, Forschungszentrum Julich, Leo-Brandt-StraBe, 52425 Juelich, Germany
J. Schmidt
Affiliation:
Institut Neel-CNRS, 25 Rue des Martyrs, 38042 Grenoble, France
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany
L. Striider
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munich, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1585 - 1586
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Ryll, H., et al, Microscopy and Microanalysis 19 (2013), p 1160–1161.CrossRefGoogle Scholar
[2] Mongillo, M., et al, ACS Nano 5 (2011), p 7117–7123.CrossRefGoogle Scholar
[3] Liu, R., et al, Nano Letters 13 (2013), p 2997–3001.Google Scholar