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High Temperature In-Situ Electron Microscopy Using A Dedicated Scanning Transmission Electron Micrscope

Published online by Cambridge University Press:  01 August 2003

T. Kamino ,
T. Yaguchi  and
T. Hashimoto
T. Kamino
Affiliation:
Hitachi Science Systems, Ltd., 11–1 Ishikawa-cho, Hitachinaka, Ibaraki, 312–0057 Japan
T. Yaguchi
Affiliation:
Hitachi Science Systems, Ltd., 11–1 Ishikawa-cho, Hitachinaka, Ibaraki, 312–0057 Japan
T. Hashimoto
Affiliation:
Hitachi High-Technologies Corp., 882 Ichige, Hitachinaka, Ibaraki, 312–8504 Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 922 - 923
Copyright
Copyright © Microscopy Society of America 2003