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High Resolution Surface Morphology Measurements using EBSD Cross-Correlation Techniques and AFM,

Published online by Cambridge University Press:  26 July 2009

MD Vaudin ,
G Stan ,
YB Gerbig  and
RF Cook
MD Vaudin
Affiliation:
National Institute of Standards and Technology
G Stan
Affiliation:
National Institute of Standards and Technology
YB Gerbig
Affiliation:
National Institute of Standards and Technology
RF Cook
Affiliation:
National Institute of Standards and Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 416 - 417
Copyright
Copyright © Microscopy Society of America 2009