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Electron Probe Microanalysis of Thin Films and Multilayers Using the X-FILM Computer Code

Published online by Cambridge University Press:  26 July 2009

X Llovet  and
C Merlet
X Llovet
Affiliation:
University of Barcelona,Spain
C Merlet
Affiliation:
University of Montpellier II,France

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 516 - 517
Copyright
Copyright © Microscopy Society of America 2009