Atomic-Resolution Imaging of Crystals Using Charge Flipping and Precession Electron Diffraction

H Hu; J-M Zuo

doi:10.1017/S1431927609093702

Atomic-Resolution Imaging of Crystals Using Charge Flipping and Precession Electron Diffraction

Published online by Cambridge University Press: 26 July 2009

H Hu and

J-M Zuo

Show author details

H Hu: Affiliation:
University of Illinois,Urbana-Champaign
J-M Zuo: Affiliation:
University of Illinois,Urbana-Champaign

Article contents

Extract

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 740 - 741

DOI: https://doi.org/10.1017/S1431927609093702 [Opens in a new window]

Article contents

Atomic-Resolution Imaging of Crystals Using Charge Flipping and Precession Electron Diffraction

Extract

Save article to Kindle

Save article to Dropbox

Save article to Google Drive

Reply to: Submit a response

Your details

You have entered the maximum number of contributors

Conflicting interests