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Atom Probe Tomography Studies of GaN-Based Semiconductor Materials

Published online by Cambridge University Press:  26 July 2009

SE Bennett ,
RA Oliver ,
DW Saxey ,
A Cerezo ,
PH Clifton ,
R Ulfig ,
MJ Kappers  and
CJ Humphreys
SE Bennett
Affiliation:
University of Cambridge,United Kingdom
RA Oliver
Affiliation:
University of Cambridge,United Kingdom
DW Saxey
Affiliation:
University of Oxford,United Kingdom
A Cerezo
Affiliation:
University of Oxford,United Kingdom
PH Clifton
Affiliation:
Imago Scientific Instruments Corp
R Ulfig
Affiliation:
Imago Scientific Instruments Corp
MJ Kappers
Affiliation:
University of Cambridge,United Kingdom
CJ Humphreys
Affiliation:
University of Cambridge,United Kingdom

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 280 - 281
Copyright
Copyright © Microscopy Society of America 2009