Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-28T04:03:14.885Z Has data issue: false hasContentIssue false
  • English
  • Français

Atmospheric Electron Microscope: Limits of Observable Depth

Published online by Cambridge University Press:  26 July 2009

M Suga ,
H Nishiyama ,
T Ebihara ,
T Ogura  and
C Sato
M Suga
Affiliation:
JEOL,Japan
H Nishiyama
Affiliation:
JEOL,Japan
T Ebihara
Affiliation:
National Institute of Industrial Science and Technology,Japan
T Ogura
Affiliation:
National Institute of Industrial Science and Technology,Japan
C Sato
Affiliation:
National Institute of Industrial Science and Technology,Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 924 - 925
Copyright
Copyright © Microscopy Society of America 2009