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Application of Focused Ion Beam to Atom Probe Tomography Specimen Preparation from Mechanically Alloyed Powders

Published online by Cambridge University Press:  28 September 2007

Pyuck-Pa Choi ,
Tala'at Al-Kassab ,
Young-Soon Kwon ,
Ji-Soon Kim  and
Reiner Kirchheim
Pyuck-Pa Choi
Affiliation:
Nano-Materials Research Center, Korea Institute of Science and Technology, P.O. Box 131, Cheongryang, Seoul 130-650, Korea
Tala'at Al-Kassab
Affiliation:
Insitut für Materialphysik, Universität Göttingen, Friedrich-Hund-Platz 1, D-37077 Göttingen, Germany
Young-Soon Kwon
Affiliation:
Research Center for Machine Parts and Materials Processing, University of Ulsan, P.O. Box 18, Ulsan 680-749, Korea
Ji-Soon Kim
Affiliation:
Research Center for Machine Parts and Materials Processing, University of Ulsan, P.O. Box 18, Ulsan 680-749, Korea
Reiner Kirchheim
Affiliation:
Insitut für Materialphysik, Universität Göttingen, Friedrich-Hund-Platz 1, D-37077 Göttingen, Germany
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Abstract

Focused ion-beam milling has been applied to prepare needle-shaped atom probe tomography specimens from mechanically alloyed powders without the use of embedding media. The lift-out technique known from transmission electron microscopy specimen preparation was modified to cut micron-sized square cross-sectional blanks out of single powder particles. A sequence of rectangular cuts and annular milling showed the highest efficiency for sharpening the blanks to tips. First atom probe results on a Fe95Cu5 powder mechanically alloyed in a high-energy planetary ball mill for 20 h have been obtained. Concentration profiles taken from this powder sample showed that the Cu distribution is inhomogeneous on a nanoscale and that the mechanical alloying process has not been completed yet. In addition, small clusters of oxygen, stemming from the ball milling process, have been detected. Annular milling with 30 keV Ga ions and beam currents ≥50 pA was found to cause the formation of an amorphous surface layer, whereas no structural changes could be observed for beam currents ≤10 pA.

Keywords

atom probe tomographymechanically alloyed powderfocused ion beamin situ lift-out techniquenanocrystalline materials
Type
MATERIALS APPLICATIONS
Information
Microscopy and Microanalysis , Volume 13 , Issue 5 , October 2007 , pp. 347 - 353
Copyright
© 2007 Microscopy Society of America

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