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Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM)
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 6 / December 2017
- Published online by Cambridge University Press:
- 28 December 2017, pp. 1096-1106
- Print publication:
- December 2017
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Electron Backscatter Diffraction and Transmission Kikuchi Diffraction Analysis of an Austenitic Stainless Steel Subjected to Surface Mechanical Attrition Treatment and Plasma Nitriding
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 4 / August 2015
- Published online by Cambridge University Press:
- 03 July 2015, pp. 919-926
- Print publication:
- August 2015
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