A method to obtain both one-dimensional powder diffraction intensities I(2θ) and statistical uncertainties σ(2θ) from the data collected with a flat two-dimensional X-ray detector is proposed. The method has been applied to analysis of the diffraction data of fine quartz powder recorded with synchrotron X-ray. The profile and magnitude of the estimated uncertainties σ(2θ) have shown that the effects of propagation of the errors in 2θ are dominant as the uncertainties about the observed intensity values I(2θ). The powder diffraction intensity data I(2θ), including nine reflection peaks have been analyzed by the Rietveld method incorporating the experimentally estimated uncertainties σ(2θ). The observed I(2θ) data have been reproduced with a symmetric peak profile function (R wp = 0.84 %), and no significant peak shifts from calculated locations have been detected as compared with the experimental errors. The optimized values of the lattice constants of the quartz sample have nominally been estimated at a = 4.9131(4) Å and c = 5.4043(2) Å, where the uncertainties in parentheses are evaluated by the Rietveld optimization based on the estimated uncertainties σ(2θ) for intensities I(2θ). It is likely that reliability of error estimation about unit-cell dimensions has been improved by this analytical method.

M2(dhtp)·nH2O (M = Mn, Co, Ni, Zn; dhtp = 2,5-dihydroxyterephthalate), known as MOF74, is a family of excellent sorbent materials for CO2 that contains coordinatively unsaturated metal sites and a honeycomb-like structure featuring a broad one-dimensional channel. This paper describes the structural feature and provides reference X-ray powder diffraction patterns of these four isostructural compounds. The structures were determined using synchrotron diffraction data obtained at beam line 11-BM at the Advanced Photon Source (APS) in the Argonne National Laboratory. The samples were confirmed to be hexagonal R 3 (No. 148). From M = Mn, Co, Ni, to Zn, the lattice parameter a of MOF74 ranges from 26.131 73(4) Å to 26.5738(2) Å, c from 6.651 97(5) to 6.808 83(8) Å, and V ranges from 3948.08 Å3 to 4163.99 Å3, respectively. The four reference X-ray powder diffraction patterns have been submitted for inclusion in the Powder Diffraction File (PDF).

Powder diffraction pattern of SP-1 graphite has been obtained using synchrotron X-ray diffraction. Unit cell dimensions were calculated using a least-squares analysis that refined to a |Δ2θ°| of no more than 0.007. A hexagonal cell was determined with a space group of P63/mmc (194), a=2.4617(2) and c=6.7106 (4) Å. The Smith/Synder figure of merit is 167 based upon 11 peaks, which indicates that the quality of this data set is superior to the existing PDF card for graphite, 41-1487. It is also emphasized that the interlayer spacing of graphite should be 3.355(1) Å. Using GAS and EXPGUI codes, a new set of calculated powder diffraction data based upon the interlayer spacing of 3.555 Å is generated. A comparison with the current calculated card, 75-1621, has also been made.