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1 results

  • Determination of Corner Positions for Calculation of Step Height of Atomic Force Microscope Images Based on ISO 5436-1

  • Adedayo S. Adebayo, Zhao Xuezeng, Wang Weijie
  • Journal:
    Microscopy and Microanalysis / Volume 19 / Issue 3 / June 2013
    Published online by Cambridge University Press:
    27 March 2013, pp. 769-774
    Print publication:
    June 2013

  • Step height is defined as the vertical spacing between two plane-parallel planes comprising an elevation or an indentation and the substrate. In atomic force microscopy (AFM), there are many algorithms for determining feature dimensions such as step height and width. One common problem of many algorithms is the difficulty for users to accurately determine the corner positions needed to properly implement the said algorithms. A new algorithm based on ISO 5436-1 is proposed that determines the necessary corner positions along with two examples illustrating the implementation of this algorithm. We propose calling this new method the determinant method. Since the corner positions are automatically decided, feature dimensions such as step height of an AFM image are easily determined. Comparative experiments carried out to compare the step height measurement using this algorithm and the SPIP software from Image Metrology show encouraging results.