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Simulation Study of Aberration-Corrected High-Resolution Transmission Electron Microscopy Imaging of Few-Layer-Graphene Stacking
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 2 / April 2010
- Published online by Cambridge University Press:
- 26 January 2010, pp. 194-199
- Print publication:
- April 2010
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- Article
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