Advances in X-ray texture solutions require new methods and descriptions for the texture analysis process, e.g., when using general area detector diffraction systems. A new method is presented that defines a general pole figure resolution and provides the possibility to optimize strategies for efficient pole figure data collection. Application of the new method improves resolution and (!) speed. New software enables simultaneous monitoring of pole and detector space. This allows a fundamentally better understanding of the collected information, e.g., in situations where peaks overlap or high backgrounds compromise data quality.