In this study the nanomorphology of P3HT:PC61BM absorber layers of organic solar cells was studied as a function of the processing parameters and for P3HT with different molecular weight. For this purpose we apply scanning transmission electron microscopy (STEM) at low electron energies in a scanning electron microscope. This method exhibits sensitive material contrast in the high-angle annular dark-field (HAADF) mode, which is well suited to distinguish materials with similar densities and mean atomic numbers. The images taken with low-energy HAADF STEM are compared with conventional transmission electron microscopy and atomic force microscopy images to illustrate the capabilities of the different techniques. For the interpretation of the low-energy HAADF STEM images, a semiempirical equation is used to calculate the image intensities. The experiments show that the nanomorphology of the P3HT:PC61BM blends depends strongly on the molecular weight of the P3HT. Low-molecular-weight P3HT forms rod-like domains during annealing. In contrast, only small globular features are visible in samples containing high-molecular-weight P3HT, which do not change significantly after annealing at 150°C up to 30 min.

Both scanning electron microscopy (SEM) and contact mode imaging via atomic force microscopy (AFM) have been utilized to elucidate the ultrastructure of mung bean seed surfaces. The results indicate: 1) that AFM is useful in the examination of seed surface ultrastructure ex-vaccuo without the need for additional complex preparative procedures; and 2) that both the cotyledon and seed coat of different strains of mung beans bear specific ultrastructural details unique to each strain. To our knowledge, these are the first AFM images of seed surfaces.