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FIB Plan View Preparation and Electron Tomography of Ga-Containing Droplets Induced by Melt-Back Etching in Si
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 1 / February 2016
- Published online by Cambridge University Press:
- 07 January 2016, pp. 131-139
- Print publication:
- February 2016
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- Article
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