Surface-sensitive information on a bulk sample can be obtained by using a low incident electron energy (low accelerating voltage/landing voltage) in a scanning electron microscope (SEM). However, topography and composition contrast obtained at low incident electron energies may not be intuitive and should be analyzed carefully. By combining an Auger electron spectrometer (AES) with a low incident electron energy SEM (LE-SEM), we investigated the SEM contrast carefully by separating the secondary electron (SE) and back-scattered electron (BSE) components with high accuracy. For this, we modified an AES to measure the electron energy in the range of 0–0.6 keV with a sample bias voltage of 0 to −0.3 keV. We could clearly observe reversed brightness of gold and carbon (graphite) in BSE images when the energy of the incident electrons was reduced to 0.2–0.3 keV. In addition, reflected electron energy spectroscopy (REELS) is known to be a tool for chemical state analysis of the sample. We demonstrated that it is possible to study the electron states of graphite, diamond, and graphene by acquiring low incident energy REELS spectra from their surfaces with the newly modified AES. This will be a new method for analyzing the electron states of local areas of a surface.

Back-scattered electron imaging with a scanning electron microscope was applied to the intimate association of fine chalcopyrite grains and sphalerite (‘chalcopyrite disease’) in synthesized products and natural specimens, in order to distinguish between diagnostic features of two formation mechanisms: replacement and coprecipitation. In the synthetic chalcopyrite disease in Fe-bearing sphalerite formed by a replacement reaction, chalcopyrite occurs as fine lamellae, which are also observed in relatively Fe-rich growth bands of the natural zoned sphalerite. Ellipsoidal to lens-like habits of chalcopyrite appear in sphalerite that has undergone extensive replacement reactions. These textures may have grown steadily from the lamellar chalcopyrite by consuming the FeS component dissolved in the sphalerite. All the sphalerite samples formed by the coprecipitation mechanism are Fe-poor, hosting triangular or irregularly bleb-like inclusions of chalcopyrite. This variety of chalcopyrite morphology could be attributed to diffusion rates and variations in fluid saturation, and their effect on the rate of crystal growth. Thus, in both replacement and coprecipitation the chalcopyrite habit depends strongly both on the FeS content of the host sphalerite and on kinetic factors, and is significant when interpreting chalcopyrite disease textures in natural samples.