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Based on the discussion in Chapters 4 and 5, combining information from both electron microscopy, presumably (Scanning) Transmission Electron Microscopy ((S)TEM), and Atom Probe Tomography (APT) is a likely path toward ASAT. Experimentally, concurrent (S)TEM and APT may appear to be a straightforward experiment, but the instrumentation required can be complex and require significant capital investment. In this chapter, we consider what instrumentation is necessary for each technique and what could be done to both simplify and improve the ASAT technique in a combined instrument that solves many of the complexities in experimentation. Experimental conditions such as vacuum pressure, cryogenic temperatures, electron imaging and diffraction, laser wavelength and positioning, and specimen holder designs must all be taken into account.
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