A task group of the JCPDS—International Centre for Diffraction Data (ICDD) was established for the purpose of investigating a methodology which would be applicable for statistical process control monitoring of X-ray powder diffractometers. A procedure for collecting X-ray diffraction data for statistical process control purposes and the incorporation of these data into control charts are presented. The results of this task group show that, through the use of statistical process control methods, noncontrol situations for diffractometers were detected, the causes of these problems were identified, and these problems were corrected and noted on control charts.
