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Improving Signal-to-Noise Ratio in Scanning Transmission Electron Microscopy Energy-Dispersive X-Ray (STEM-EDX) Spectrum Images Using Single-Atomic-Column Cross-Correlation Averaging
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue 3 / June 2016
- Published online by Cambridge University Press:
- 28 March 2016, pp. 536-543
- Print publication:
- June 2016
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- Article
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