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Thickness Variations and Absence of Lateral Compositional Fluctuations in Aberration-Corrected STEM Images of InGaN LED Active Regions at Low Dose
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014
- Published online by Cambridge University Press:
- 26 March 2014, pp. 864-868
- Print publication:
- June 2014
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- Article
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