The continuous conversion of smectite to illite in samples from the Shinzan hydrothermal alteration area of Japan has been examined by X-ray powder diffraction (XRD) and transmission (TEM) and analytical transmission electron microscopy (AEM). TEM shows that randomly interstratified illite/ smectite (I/S) containing 100-50% expandable layers exhibits a flakey shape, whereas regularly and partially ordered interstratified I/S having 50-0% expandable layers exhibits a lath-like habit. An early- formed lath of regularly interstratified I/S is typically <35 Å in thickness and 300–500 Å in width; these dimensions gradually increase with decreasing percentage of expandable layers. XRD shows that the lathshaped I/S has a 1M polytype mica structure. AEM shows that the interlayer K content of flakey I/S increases monotonously with decreasing percentage of expandable layers in the range 100-50% expandable layers, whereas the interlayer K content of lath-shaped I/S increases along a different trend from that for the flakey I/S in the range 50-0% expandable layers. These observations suggest that randomly interstratified I/S is fundamentally smectite that is undergoing K-fixation and dissolution and that regularly and partially ordered interstratified I/S are immature illite which is still growing. Consequently, they suggest a mechanism for the hydrothermal smectite-to-illite conversion that is based on the K-fixation in and dissolution of smectite and the precipitation and growth of thin illite particles. Furthermore, these data suggest that the kinetics of smectite dissolution and illite growth are the most important factors controlling the smectite-to-illite conversion.

A new method for calculation of layer charge and charge distribution of smectites is proposed. The method is based on comparisons between X-ray diffraction (XRD) patterns of K-saturated, ethylene glycol-solvated, oriented samples and calculated XRD patterns for three-component, mixed-layer systems. For the calculated patterns it is assumed that the measured patterns can be modeled as random interstratifications of fully expanding 17.1 Å layers, partially expanding 13.5 Å layers and non-expanding 9.98 Å layers. The technique was tested using 29 well characterized smectites. According to their XRD patterns, smectites were classified as group 1 (low-charge smectites) and group 2 (high-charge smectites). The boundary between the two groups is at a layer charge of −0.46 equivalents per half unit-cell. Low-charge smectites are dominated by 17.1 Å layers, whereas high-charge smectites contain only 20% fully expandable layers on average. Smectite properties and industrial applications may be dictated by the proportion of 17.1 Å layers present. Non-expanding layers may control the behavior of smectites during weathering, facilitating the formation of illite layers after subsequent cycles of wetting and drying. The precision of the method is better than 3.5% at a layer charge of −0.50; therefore the method should be useful for basic research and for industrial purposes.