5 results
XPS Surface analysis augmented using correlative spectroscopy and microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, p. 978
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Extending XPS Surface Analysis with Correlative Spectroscopy and Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, p. 1016
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Utilizing Correlative, Multi-Technique Surface Analysis to Complement Microscopy Studies
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1046-1047
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Making Light Work: Enhancing Surface and Thin Film Analysis through In-Situ Complementary Spectroscopies
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 370-371
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Characterizing Materials for Energy Generation Using X-ray Photoelectron Spectroscopy (XPS)
-
- Journal:
- Microscopy Today / Volume 19 / Issue 2 / March 2011
- Published online by Cambridge University Press:
- 28 February 2011, pp. 22-28
- Print publication:
- March 2011
-
- Article
-
- You have access
- HTML
- Export citation