2 results
Structural properties of Si nanoclusters produced by thermal annealing of SiOx films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 817 / 2004
- Published online by Cambridge University Press:
- 15 March 2011, L6.12
- Print publication:
- 2004
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- Article
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Structural characterization of silicon nanostructures by energy filtered transmission electron microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 206-207
- Print publication:
- September 2003
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- Article
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