1 results
Influence of the X-ray diffraction line profile analysis method on the structural and microstructural parameters determination of sol-gel TiO2 powders
-
- Journal:
- Powder Diffraction / Volume 24 / Issue 3 / September 2009
- Published online by Cambridge University Press:
- 29 February 2012, pp. 205-220
-
- Article
- Export citation