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High Performance in Low Voltage HR-STEM Applications Enabled By Fast Automatic Tuning of the Combination of a Monochromator and Probe Cs-Corrector
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 980-981
- Print publication:
- July 2016
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Extreme High-Resolution SEM: A Paradigm Shift
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- Journal:
- Microscopy Today / Volume 16 / Issue 4 / July 2008
- Published online by Cambridge University Press:
- 14 March 2018, pp. 24-29
- Print publication:
- July 2008
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Electrostatic Aberration Correction in Low-Voltage SEM
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 24-25
- Print publication:
- September 2003
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