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Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 514-515
- Print publication:
- July 2012
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Spherical Aberration Corrected TEM/STEM Analysis of La2O3 Thin Film Deposited on Si (001) Substrate
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1010-1011
- Print publication:
- July 2009
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- Article
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