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Investigation of the Atomic Structures of Si3N4/CeO2-δ Interfaces using Atomic Resolution Z-contrast Imaging and EELS combined with First-Principles Methods
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1364-1365
- Print publication:
- August 2008
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- Article
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