2 results
Dielectric breakdown Characteristics of poly-Si/HfAlOx/SiON gate stack
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- Journal:
- MRS Online Proceedings Library Archive / Volume 811 / 2004
- Published online by Cambridge University Press:
- 28 July 2011, D2.7
- Print publication:
- 2004
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Point defects in thin HfAlOx films probed by monoenergetic positron beams
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- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E1.2
- Print publication:
- 2003
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- Article
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