5 results
Synchrotron X-ray Topography Studies of Epitaxial Lateral Overgrowth of GaN on Sapphire
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- Journal:
- MRS Online Proceedings Library Archive / Volume 572 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 327
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- 1999
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Epitaxial Lateral Overgrowth of Gallium Arsenide Studied by Synchrotron Topography
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- Journal:
- MRS Online Proceedings Library Archive / Volume 570 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 181
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- 1999
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The Use of X-ray Topography to Map Mechanical, Thermomechanical and Wire-Bond Strain Fields in Packaged Integrated Circuits
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- Journal:
- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 241
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- 1997
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An Examination of the Crystalline Quality of 200mm Diameter Silicon Substrates using X-ray Topography
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- Journal:
- MRS Online Proceedings Library Archive / Volume 469 / 1997
- Published online by Cambridge University Press:
- 15 February 2011, 83
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- 1997
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Synchrotron x-Ray Topographic Study Of Dislocations In Gaas Detector Crystals Grown By Vertical Gradient Freeze Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 487 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 459
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- 1997
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